4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Sam-Soo Kim

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Self burn-in circuit for semiconductor memory

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Semiconductor memory device for reducing write recovery time

Static information storage and retrieval – Read/write circuit – Flip-flop used for sensing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2559799

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