4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Richard Torczon

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Diffraction device which detects the Bragg condition

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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High-T.sub.c superconductor contact unit having low interface re

Superconductor technology: apparatus – material – process – High temperature – per se – Having tc greater than or equal to 150 k
Patent

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Multi-tipped field-emission tool for nanostructure fabrication

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With microwave gas energizing means
Patent

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Profile ID: LFUS-PAI-P-653847

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