4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Richard Orban

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Method and apparatus for testing for latch-up in integrated...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method of using hot-carrier-injection degradation as a...

Static information storage and retrieval – Floating gate – Particular biasing
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Profile ID: LFUS-PAI-P-2672210

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