4. Optics: measuring and testing
  5. By polarized light examination
  6. With light attenuation

Richard Dorman

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Reflectivity compensating system for fiber optic sensor employin

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Wafer resistance measurement apparatus and method using...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Profile ID: LFUS-PAI-P-1781457

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