4. Optics: measuring and testing
  5. By configuration comparison
  6. With photosensitive film or plate

Richard Bosmans

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Method and device for in situ stress measurement within a thin f

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for depositing a fluorine-doped silica film

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate

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Method for obtaining an ophthalmic lens comprising a surface...

Plastic and nonmetallic article shaping or treating: processes – Optical article shaping or treating – Light polarizing article or holographic article
Reexamination Certificate

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Organic substrate having optical layers deposited by...

Stock material or miscellaneous articles – Circular sheet or circular blank – Recording medium or carrier
Reexamination Certificate

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Transparent and polarizing vision element having areas which...

Optics: eye examining – vision testing and correcting – Spectacles and eyeglasses – Ophthalmic lenses or blanks
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1528362

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