4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Electrical signal parameter measurement system

Raymond E. Anderson

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Method and system for measuring equivalent series resistance...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Method for determining the desired decoupling components for...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate

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Methodology for determining the placement of decoupling...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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System and method for analyzing simultaneous switching noise

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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System and method for determining the decoupling capacitors...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2124780

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