4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Pil-sik Hyun

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Method and apparatus for detecting thickness of thin layer...

Radiant energy – Photocells; circuits and apparatus – With circuit for evaluating a web – strand – strip – or sheet
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method of and device for detecting micro-scratches

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method of and device for detecting micro-scratches

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Wafer inspection system and method for selectively...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Pil-sik Hyun does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Pil-sik Hyun, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pil-sik Hyun will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2433876

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure