4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Phillip J Nigh

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Method for identifying long paths in integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Using time resolved light emission from VLSI circuit devices...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1849281

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