4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Peter Eldredge

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Automatic system and method for inspecting hole quality

Image analysis – Histogram processing – For setting a threshold
Patent

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Data analysis flow engine

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Spatial signature analysis

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-470199

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