4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Transmission facility testing

Peter D. Maroni

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Hierarchical metal one usage tool for child level leaf cell

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and apparatus for loopback self testing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2317715

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