4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Having predetermined light transmission regions

Paul Esrig

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Emission microscopy system

Facsimile and static presentation processing – Facsimile – Specific signal processing circuitry
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Method and apparatus for detecting non-uniformities in reflectiv

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
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Profile ID: LFUS-PAI-P-1876117

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