4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Lumped type parameters

Pascal Jordil

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Adjustable probe

Geometrical instruments – Gauge – Movable contact probe – per se
Reexamination Certificate

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Adjustable probe

Geometrical instruments – Gauge – Having a movable contact probe
Reexamination Certificate

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Adjustable probe

Geometrical instruments – Gauge – Movable contact probe – per se
Reexamination Certificate

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Adjustable probe

Geometrical instruments – Gauge – Movable contact probe – per se
Reexamination Certificate

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Capacitive device for measuring dimension

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent

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Profile ID: LFUS-PAI-P-1865505

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