4. Image analysis
  5. Histogram processing

Omri Govrin

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Emissivity-independent silicon surface temperature measurement

Thermal measuring and testing – Temperature measurement – Nonelectrical – nonmagnetic – or nonmechanical temperature...
Reexamination Certificate

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Inspection of a printing cylinder

Facsimile and static presentation processing – Static presentation processing – Attribute control
Reexamination Certificate

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Method for identifying film type

Image analysis – Histogram processing
Patent

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Profile ID: LFUS-PAI-P-1267757

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