Nobuo Matsushita

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Apparatus for measuring optical-axis deflection angle of headlig

Optics: measuring and testing – Lamp beam direction or pattern
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Luminaire

Illumination – Light source and modifier – Including reflector
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Luminaire

Illumination – Light source and modifier – Including reflector
Patent

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Polymerization rate detection method

Measuring and testing – Liquid analysis or analysis of the suspension of solids in a... – Lubricant testing
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Reflector

Patent

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Profile ID: LFUS-PAI-P-1357692

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