4. Semiconductor device manufacturing: process
  5. With measuring or testing

Nick Atchison

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Method for analyzing probe yield sensitivities to IC design

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method for the calculation of wafer probe yield limits from...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate

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Method of a comprehensive sequential analysis of the yield...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2064527

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