4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Naoya Murota

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Defect inspection method for three-dimensional object

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method and system for detecting a defect in projected...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2725381

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