4. Optical: systems and elements
  5. Single channel simultaneously to or from plural channels
  6. By surface composed of lenticular elements

Mitsuru Namiki

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Apparatus and method for measuring eccentricity of...

Optics: measuring and testing – Lens or reflective image former testing – Optical center – cylinder axis – or prism measuring or...
Reexamination Certificate

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Focal length measuring device

Optics: measuring and testing – Lens or reflective image former testing – Focal length measuring
Reexamination Certificate

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Focus detecting unit, and refractive index measuring...

Optics: measuring and testing – Refraction testing
Reexamination Certificate

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Microscope apparatus

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate

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Multiple image optics system

Optical: systems and elements – Single channel simultaneously to or from plural channels – By surface composed of lenticular elements
Patent

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Profile ID: LFUS-PAI-P-796368

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