4. Compositions
  5. Inorganic luminescent compositions
  6. Tungsten containing

Mitsuo Takeda

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Apparatus for interferometrically measuring the physical propert

Optics: measuring and testing – Refraction testing – Prism engaging specimen
Patent

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Compound semiconductor particles and production process...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate

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Cover glass structure of flat type indicator tube

Electric lamp and discharge devices – With envelope
Patent

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Displacement detection method, displacement detection...

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate

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Electronic part

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Solder wettable contact – lead – or bond
Reexamination Certificate

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Profile ID: LFUS-PAI-P-47515

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