4. Static information storage and retrieval
  5. Read/write circuit
  6. Having fuse element

Micron Technology Corporation

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Apparatus for testing redundant elements in a packaged semicondu

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Clock frequency detector for a synchronous memory device

Static information storage and retrieval – Addressing – Sync/clocking
Patent

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Shared pull-up and selection circuitry for programmable cells su

Static information storage and retrieval – Read/write circuit – Having fuse element
Patent

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