4. Semiconductor device manufacturing: process
  5. With measuring or testing

Michael Verne Fenske

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Electrically quantifying transistor spacer width

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method and apparatus for electrically measuring insulating...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2010624

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