4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

Michael McNamara

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High speed resiliometer

Measuring and testing – Testing by impact or shock – Specimen impactor detail
Reexamination Certificate

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System and method for identifying finite state machines and...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2538197

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