4. Data processing: generic control systems or specific application
  5. Specific application, apparatus or process
  6. Product assembly or manufacturing

Michael Geffen

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Confocal wafer-inspection system

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method and apparatus for analyzing cuts

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2149240

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