4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

MFI Technologies Corporation

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Method and apparatus for sub-micron imaging and probing on...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Scanning force microscope probe cantilever with reflective...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2129324

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