4. Optics: measuring and testing
  5. Refraction testing
  6. Prism engaging specimen

Matsuo Takashima

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Acoustic wave scanning apparatus

Communications – electrical: acoustic wave systems and devices – Receiver circuitry
Patent

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Highly sensitive process for measuring fine deformation

Optics: measuring and testing – Refraction testing – Prism engaging specimen
Patent

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Profile ID: LFUS-PAI-P-1114173

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