4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Masahiko Nikaidou

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Gain measurement device for optical amplifier and method...

Optical: systems and elements – Optical amplifier – Correction of deleterious effects
Reexamination Certificate

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High-frequency probe capable of adjusting characteristic...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method for fabricating probe tip portion composed by coaxial...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Process for manufacturing high frequency multichip module...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Tip portion structure of high-frequency probe and method for...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2023644

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