4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Mary R. Olynick

Attorney

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Apparatus and methods for reducing thin film color variation...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Multi-pixel methods and apparatus for analysis of defect...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2618656

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