4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

M. Kent Norton

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Method and system for inspecting the surface of a wafer

Image analysis – Applications – Manufacturing or product inspection
Patent

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System and method for measurement of traveling webs

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Patent

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Viewing and display apparatus

Computer graphics processing and selective visual display system – Image superposition by optical means
Patent

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Profile ID: LFUS-PAI-P-1165827

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