4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Lowell D. Jacobson

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Machine vision system for analyzing features based on...

Image analysis – Pattern recognition – Template matching
Reexamination Certificate

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Machine vision system for object feature analysis and...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method and apparatus for detecting extended defects in an object

Image analysis – Applications – Manufacturing or product inspection
Patent

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Vision system for analyzing solid-of-revolution radius profile

Data processing: measuring – calibrating – or testing – Calibration or correction system – Length – distance – or thickness
Patent

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Profile ID: LFUS-PAI-P-1165835

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