4. Optics: measuring and testing
  5. By polarized light examination
  6. With light attenuation

Laszlo Landstein

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Combined scanning force microscope and optical metrology tool

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Integrated tip strain sensor for use in combination with a singl

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Integrated tip strain sensor for use in combination with a singl

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Profile ID: LFUS-PAI-P-1001111

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