4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Kwun-soo Cheon

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High voltage generating circuit and method and semiconductor...

Static information storage and retrieval – Read/write circuit – Precharge
Reexamination Certificate

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Parallel bit test apparatus and parallel bit test method...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2242084

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