4. Metal working
  5. Method of mechanical manufacture
  6. Electrical device making

Krzysztof Dabrowiecki

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Assembly structure for making integrated circuit chip probe card

Metal working – Method of mechanical manufacture – Electrical device making
Patent

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Assembly structure for making integrated circuit chip probe...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Bundled probe apparatus for multiple terminal contacting

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1852168

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