4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Of circuit

Kozo Nuriya

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Analog-to-digital converting system

Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion
Patent

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Microprocessor and method of testing the same

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Patent

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Multi-stage noise shaping over-sampling D/A converter

Coded data generation or conversion – Analog to or from digital conversion – Differential encoder and/or decoder
Patent

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Profile ID: LFUS-PAI-P-536584

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