4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Keith V. Pearson

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Evanescent wave liquid level sensor with density compensation

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Patent

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Ion drag air flow meter

Electricity: measuring and testing – Using ionization effects – For analysis of gas – vapor – or particles of matter
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X-ray fluorescence imaging of elements

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Profile ID: LFUS-PAI-P-1540904

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