4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Keiichi Saiki

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Apparatus and method of inspecting foreign particle or...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Method of inspecting circuit pattern and inspecting instrument

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method of inspecting circuit pattern and inspecting instrument

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2587998

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