4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Kees Moddemeyer

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Apparatus and method for inspecting circuit structures

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Head mounted display device

Computer graphics processing and selective visual display system – Image superposition by optical means
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Profile ID: LFUS-PAI-P-2184672

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