4. Measuring and testing
  5. Sampler, sample handling, etc.
  6. Capture device

Justin Lowe

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Ion implanter

Radiant energy – With charged particle beam deflection or focussing – With target means
Reexamination Certificate

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Surface particle sampling head having a rotatable probe

Measuring and testing – Sampler – sample handling – etc. – Capture device
Patent

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Profile ID: LFUS-PAI-P-525346

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