4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Jung Hur

Examiner

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Circuit for testing ferroelectric capacitor in FRAM

Static information storage and retrieval – Read/write circuit – Testing
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Device threshold calibration through state dependent burn-in

Static information storage and retrieval – Read/write circuit – Complementing/balancing
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Profile ID: LFUS-PAI-P-2755599

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