4. Electricity: measuring and testing
  5. Determining nonelectric properties by measuring electric...

Jung Chuan Chou

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&agr;-WO3-gate ISFET devices and method of making the same

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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A-WO3-gate ISFET devices and method of making the same

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Chemically responsive
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Apparatus for measuring temperature parameters of an ISFET...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method and apparatus for measuring temperature parameters of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method for measuring drift values of an ISFET using the...

Electricity: measuring and testing – Determining nonelectric properties by measuring electric...
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Profile ID: LFUS-PAI-P-2594769

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