4. Image analysis
  5. Pattern recognition
  6. Feature extraction

Jun Wakitani

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Method for determining orientation of contour line segment in lo

Image analysis – Pattern recognition – Feature extraction
Patent

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Method for determining orientation of contour line segment in lo

Image analysis – Pattern recognition – Feature extraction
Patent

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Method for determining orientation of contour line segment in lo

Image analysis – Pattern recognition – Feature extraction
Patent

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Moving-target tracking apparatus

Television – Object tracking
Patent

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Three-dimensional measuring apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Profile ID: LFUS-PAI-P-403673

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