4. Data processing: measuring, calibrating, or testing
  5. Calibration or correction system
  6. Sensor or transducer

Judson K. Champlin

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II-VI semiconductor device with BeTe buffer layer

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – With particular semiconductor material
Reexamination Certificate

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Interface for managing process

Data processing: measuring – calibrating – or testing – Calibration or correction system – Sensor or transducer
Reexamination Certificate

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Passivation capping layer for ohmic contact in II-VI...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Compound semiconductor
Reexamination Certificate

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Press-fit remote diaphragm assembly

Measuring and testing – Fluid pressure gauge – Mounting and connection
Reexamination Certificate

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Resistance based process control device diagnostics

Data processing: measuring – calibrating – or testing – Calibration or correction system – Temperature
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2134583

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