4. Semiconductor device manufacturing: process
  5. With measuring or testing
  6. Electrical characteristic sensed

Jong Il Kim

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Back light unit and manufacturing method thereof

Illumination – Edge lighted panel – Light modifier for edge lit light source
Reexamination Certificate

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Ceramide-like compounds and a method for preparation thereof, an

Organic compounds -- part of the class 532-570 series – Organic compounds – Fatty compounds having an acid moiety which contains the...
Patent

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Liquid crystal display device and method of manufacturing...

Liquid crystal cells – elements and systems – Particular structure – Having significant detail of cell structure only
Reexamination Certificate

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Measuring pattern for measuring width of wire in...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Method for measuring width of wire in semiconductor device using

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Patent

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Profile ID: LFUS-PAI-P-359358

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