4. Measuring and testing
  5. Miscellaneous

John T. Eagan

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Method and apparatus for compacting material samples

Measuring and testing – Miscellaneous
Patent

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Thin layer nuclear density gauge

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Thin layer nuclear density guage

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1978500

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