4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

John S. Smyth

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Feedback method utilizing lithographic exposure field...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Indicating network resource availability methods, system and...

Electrical computers and digital processing systems: multicomput – Computer network managing – Computer network monitoring
Reexamination Certificate

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Method of photolithographic critical dimension control by...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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System and method for optimizing manufacturing processes...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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System and method for optimizing metrology sampling in APC...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2613773

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