4. Optics: measuring and testing
  5. Inspection of flaws or impurities

John Nazarian Pike

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Apparatus and method for viewing and inspecting a circumferentia

Optics: measuring and testing – Inspection of flaws or impurities
Patent

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Apparatus and method for viewing and inspecting a circumferentia

Optics: measuring and testing – Inspection of flaws or impurities
Patent

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Apparatus for viewing and inspecting a surface area of an...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1220804

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