4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

John M. Carulli, Jr.

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Method for estimating the early failure rate of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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System and method for estimating test escapes in integrated...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2289401

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