4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

John F. Hagios

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Method for wafer test and wafer test system for implementing...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Probe card assembly

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer test space transformer

Inductor devices – Coil or coil turn supports or spacers – Printed circuit-type coil
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Profile ID: LFUS-PAI-P-2741171

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