4. Measuring and testing
  5. Sampler, sample handling, etc.
  6. Capture device

Johannes A. Van Niekerk

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Functional pathway configuration at a system/IC interface

Electronic digital logic circuitry – Interface – Logic level shifting
Reexamination Certificate

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Method of sampling, and sampling device

Measuring and testing – Sampler – sample handling – etc. – Capture device
Patent

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Profile ID: LFUS-PAI-P-210123

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