4. Data processing: structural design, modeling, simulation, and em
  5. Simulating nonelectrical device or system

Jing Wan

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Double-radiant-source framework for container detecting system

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Enriched multi-point flux approximation

Data processing: structural design – modeling – simulation – and em – Simulating nonelectrical device or system
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2215388

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