4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Jing-Reng Huang

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Method and apparatus for controlling a dual-slope integrator...

Miscellaneous active electrical nonlinear devices – circuits – and – Specific input to output function – By integrating
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Programmable built in self test for embedded DRAM

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Test pattern generator for SRAM and DRAM

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2432864

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