4. Image analysis
  5. Image transformation or preprocessing

Jerome R. Lovelace

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Method and apparatus for yield and failure analysis in the...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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System and method for recognizing visual indicia

Image analysis – Image transformation or preprocessing
Patent

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System and method for recognizing visual indicia

Image analysis – Image transformation or preprocessing
Patent

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Profile ID: LFUS-PAI-P-383493

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